Ion-tofジャパン
Webインタビュー. SI NEWSが独自に取材したインタビュー記事をお届けします。. さらに表示. 登録記事数 202 件. まだまだあります。. キーワード検索で探せます. 関連リンク. 日立 … Web31 jan. 2024 · Time-of-flight secondary ion mass spectrometry is extremely surface sensitive and has superior chemical selectivity, making this surface analytical technique powerful and often unique in identifying chemical structures and exploring surface chemistry.With its imaging capability, ToF-SIMS is especially useful in materials failure …
Ion-tofジャパン
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Web3 nov. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and atmospheric pressure matrix-assisted laser desorption/ionization (AP-MALDI) offer complementary capabilities. Here, we present a workflow to apply both techniques to a single tissue section and combine the resulting data for the example of human colon cancer tissue. Methods Web25 mei 2024 · IONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis …
WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis About IONTOF Data & Facts Vision Web飞行时间二次离子质谱（tof-sims）是德国iontof最主要的高端表面分析设备之一。 ... 我司作为德国ion-tof公司的中国总代理，成立于2012年。主要负责中国大陆及港澳地区的销售 …
WebModern ion TOF spectrometers equipped with accurate position-sensitive detectors are capable of recording the data for complete ion momentum reconstruction. On the same example of N2 above, one can confidently assume that the true coincident ions should have the momentum vectors antiparallel and of equal length, as to Web18 jan. 2024 · IONTOF M6 ToF-SIMS. Time of Flight – Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface sensitive analytical technique that provides detailed elemental, isotopic and molecular information about surfaces, interfaces and thin layers with nanoscale spatial resolution and parts per billion sensitivity.
WebIONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis
WebIONTOF is the technological leader in the field of TOF-SIMS and LEIS instrumentation. the IONTOF group consists of four different companies. The ION-TOF Gesellschaft für … devilbiss jga-510 spray gun specificationshttp://www.iontof.com.cn/ churchfitters christmas crackerWebToFカメラの製品・製造メーカーを一覧にして紹介 (2024年版)。ToFカメラ関連企業の2024年3月注目ランキングは1位:パナソニック株式会社、2位:バスラー・ジャパン株式会社(Basler Japan)、3位:LUCID Vision Labs G.Kとなっています。 devilbiss kb-555 parts breakdownWeb29 jun. 2014 · We present a comparative study of the time-of-flight-secondary ion mass spectrometry (ToF-SIMS), Fourier transform infrared (FT-IR) spectroscopy and X-ray photoelectron spectroscopy (XPS) techniques on a mixed self-assembled monolayer (SAM) of biotinylated polyethylene glycol alkane thiol (BPT) and 11-mercaptoundecanol (MUD) … devilbiss malaysiaWeb二次離子質譜儀 (TOF-SIMS) 儀器中文名稱：飛行時間二次離子質譜儀 儀器英文名稱：Time-of-Flight Secondary Ion Mass Spectrometer 儀器英文簡稱：TOF-SIMS 儀器設備說明： 儀器開放年度：2024年 廠牌及型號：德國 ION-TOF, TOF-SIMS V 重要規格： 分析離子源：Ar+、Bi+ 濺射離子源：O2+、Cs+ 質量分析器：飛行時間式 質量解析：> 10000 質量 … churchfitters bandWebIONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). ... ION-TOF USA, Inc. 100 Red Schoolhouse Road Building A8 Chestnut Ridge, NY 10977 Phone Fax Email (845) 352 - 8082 devilbiss kb 555 service manualWeb29 mrt. 2016 · ToF-SIMS spectra were obtained with a ToF-SIMS V (ION-TOF GmbH, Germany) equipped with a 25 keV Bi 3+ ion gun. For the ToF-SIMS spectrum, the ion gun was operated at 8.3 kHz with an average current of 0.28 pA (Bi 3+) at the sample holder. A bunch pulse of 0.7 ns duration resulted in mass resolution (M/ M) > 8000 at m/z 760. church fitness classes